Download Introduction to Advanced System-on-Chip Test Design and by Erik Larsson PDF

By Erik Larsson

SOC try layout and its optimization is the subject of Introduction to complex System-on-Chip try layout and Optimization. It supplies an advent to trying out, describes the issues on the topic of SOC checking out, discusses the modeling granularity and the implementation into EDA (electronic layout automation) instruments. The ebook is split into 3 sections: i) attempt innovations, ii) SOC layout for attempt, and iii) SOC attempt functions. the 1st half covers an creation into try out difficulties together with faults, fault forms, design-flow, design-for-test concepts similar to scan-testing and Boundary test. the second one a part of the e-book discusses SOC similar difficulties reminiscent of approach modeling, try out conflicts, strength intake, try entry mechanism layout, attempt scheduling and defect-oriented scheduling. eventually, the 3rd half makes a speciality of SOC purposes, equivalent to built-in attempt scheduling and TAM layout, defect-oriented scheduling, and integrating attempt layout with the middle choice process.

Show description

Read Online or Download Introduction to Advanced System-on-Chip Test Design and Optimization (Frontiers in Electronic Testing) PDF

Similar products books

Rapid Prototyping of Digital Systems, SOPC Edition

Fast PROTOTYPING OF electronic structures offers an exhilarating and not easy setting for quickly adapting System-on-a-Programmable Chip (SOPC) know-how to latest designs or integrating the recent layout equipment right into a laboratory part for electronic common sense, desktop and embedded-design curriculums.

SMT Soldering Handbook

Floor Mount know-how has had a profound effect at the electronics undefined, and has resulted in using new fabrics, innovations and production tactics. because the first variation of this e-book was once written, digital assemblies have persisted to develop into nonetheless smaller and extra complicated, whereas soldering nonetheless continues to be the dominant connecting process.

Corrosion in Systems for Storage and Transportation of Petroleum Products and Biofuels: Identification, Monitoring and Solutions

This ebook treats corrosion because it happens and impacts procedures in real-world events, and therefore issues find out how to sensible recommendations. themes defined contain the stipulations during which petroleum items are corrosive to metals; corrosion mechanisms of petroleum items; which components of garage tanks containing crude oils and petroleum items endure corrosion; dependence of corrosion in tanks on kind of petroleum items; aggressiveness of petroleum items to polymeric fabric; how microorganisms participate in corrosion of tanks and pipes containing petroleum items; which corrosion tracking equipment are utilized in platforms for garage and transportation of petroleum items; what corrosion keep watch over measures will be selected; tips on how to decide upon coatings for internal and outer surfaces of tanks containing petroleum items; and the way diversified ingredients (oxygenates, fragrant solvents) to petroleum items and biofuels effect metal and polymeric fabrics.

Extra info for Introduction to Advanced System-on-Chip Test Design and Optimization (Frontiers in Electronic Testing)

Example text

The best solution, found using exhaustive search in the local neighborhood (steepest decent), is used as the next solution. In practice the search in the local neighborhood can be terminated at first improvement. The first improvement makes use of less computational cost compared to the steepest decent. However, in steepest decent each iteration creates a better solution, which can lead to less required iterations, hence less computational cost, compared to using first improvement. In order to avoid getting stuck at local optimum, a larger neighborhood can be used.

In order to detect a delay fault, two test vectors are used. The first vector initializes the design and the second vector, applied in the consecutive clock cycle, captures the fault. Furthermore, it is important that the testing is performed at system speed, otherwise the timing fault is most likely not present. A disadvantage of the scan technique is that it is difficult to apply the two vectors in consecutive clock cycle. The scan technique requires test vector shift-in, capture, and then shift-out.

E. one test is performed when all scan-chains are loaded/unloaded. Long scan chain lead to long testing times. In order to reduce the test application time, a higher number of scan chains can be used, which reduces the loading/unloading time since it is performed concurrent over all scan chains. In a test-per-clock scheme there is one test per clock cycle. 3 LOCST (LSSD On-Chip Self-Test) In the LOCST (LSSD On-Chip Self-Test) architecture the test data is transported to the circuit under test using a boundary scan chain [179].

Download PDF sample

Rated 4.25 of 5 – based on 35 votes